Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy

European Journal of Mineralogy

Volumn 16, Issue 6, 2004, Pages 863-876

  Wirth, Richard ^a  

^a GFZ GERMAN RESEARCH CENTRE FOR GEOSCIENCES   (Germany)

Author keywords

Focused Ion Beam (FIB); Geological materials; Specimen preparation; TEM

Indexed keywords

CARBON; COATINGS; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; FILM PREPARATION; FOCUSED ION BEAMS; GALLIUM COMPOUNDS; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; IONS; MINERALS; SILICATES; SPECIMEN PREPARATION; TRANSMISSION ELECTRON MICROSCOPY;

ADVANCED APPLICATIONS; ANALYTICAL ELECTRON MICROSCOPY; CARBON COATING; CARBON SUPPORT FILMS; DIFFRACTION TECHNIQUES; ELEMENTAL MAPPING; GEOLOGICAL MATERIALS; STAND-ALONE INSTRUMENTS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

FOCUSED ION BEAM MICROSCOPY; MICROSCOPY; MINERALOGY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 11244250588     PISSN: 09351221     EISSN: None     Source Type: Journal    
DOI: 10.1127/0935-1221/2004/0016-0863     Document Type: Article

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