Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials

American Mineralogist

Volumn 86, Issue 9, 2001, Pages 1094-1099

  Heaney, P J ^a   Vicenzi, E P ^a   Giannuzzi, L A ^a   Livi, K J T ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSED ION BEAMS; IONS; MILLING (MACHINING); MINERALS; TRANSMISSION ELECTRON MICROSCOPY;

ARGON ION MILLING; ELECTRON TRANSPARENCY; FOCUSED ION BEAM MILLING; LIFT-OUT TECHNIQUES; NANOMETER-SCALE PRECISION; PLANETARY MATERIALS; SAMPLE EXTRACTION; SELECTIVE THINNING;

ELECTRON PROBE MICROANALYSIS;

CRYSTALLOGRAPHY; LABORATORY METHOD; MINERALOGY; THIN SECTION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034776455     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2001-8-917     Document Type: Article

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