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Volumn 107, Issue 7, 2010, Pages

M -plane (10 1- 0) InN heteroepitaxied on (100) -γ -LiAlO2 substrate: Growth orientation control and characterization of structural and optical anisotropy

(11) Hsiao, Ching Lien a Chen, Jr Tai a Hsu, Hsu Cheng a Liao, Ying Chieh a,b Tseng, Po Han c Chen, Yen Ting b,d Feng, Zhe Chuan a Tu, Li Wei c Chou, Mitch M C e Chen, Li Chyong a Chen, Kuei Hsien a,b,d

a NATIONAL TAIWAN UNIVERSITY (Taiwan)

b INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES (Taiwan)

c NATIONAL SUN YAT SEN UNIVERSITY (Taiwan)

d ACADEMIA SINICA (Taiwan)

e NATIONAL SUN YAT SEN UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE-DEPENDENT; COLUMNAR STRUCTURES; ELECTRON BACK SCATTER DIFFRACTION; GROWTH CONDITIONS; GROWTH ORIENTATIONS; HETEROEPITAXIAL GROWTH; HETEROEPITAXY; INN FILMS; LAO SUBSTRATE; LATTICE-MATCHED; M-PLANE; MISFIT STRAINS; PHONON MODE; PHOTOLUMINESCENCE EMISSION; PL SPECTROSCOPY; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; POLARIZATION ANISOTROPY; POLARIZATION DEGREE; PRE-TREATMENT; RAMAN SELECTION RULES; STACKING SEQUENCE; STRUCTURAL ANISOTROPY; TEM; TEM ANALYSIS; UV-RAMAN SPECTRA; WILLIAMSON-HALL;

ANISOTROPY; EPITAXIAL GROWTH; INFRARED SPECTROSCOPY; POLARIZATION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; SUBSTRATES; SURFACE TREATMENT; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION;

FILM GROWTH;

EID: 77951619201 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3359680 Document Type: Article

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.