Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 77, Issue 4, 1998, Pages 1013-1025

  Christiansen, S ^d   Albrecht, M ^d   Strunk, H P ^d  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

^c SIEMENS AG   (Germany)

^d UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032056159     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619808221225     Document Type: Article

References (24)

1. Ambacher, O., Angerer, H., Dimitrov, R., Rieger, W., Stutzmann, M., Dollinger, G., and Bergmaier, A., 1997, Phys. Status, solidi, (a), 159, 105.
2. Ayers, J. E., 1994, J. Crystal Growth, 135, 71.
3. Balzar, D., and Popovic, S., 1996, J. appi. Crystallogr., 29, 16.
4. Compton, A. H., and Allison, S. K., 1935, X-Rays in Theory and Experiment (New York: Van Nostrand).
5. De Keijser, T. H., Mittemeijer, E. J., and Rozendaal, H. C. F., 1983, J. appi. Crystallogr., 16, 309.
6. Dunn, C. O., and Koch, E. F., 1957, Acta melali., 5, 548.
7. Fatemi, M., Chaudhuri, J., Mittereder, J., and Christou, A., 1993, J. appi. Phys., 73, 1154.
8. Fewster, P. F., 1989, J. appi. Crystallogr., 22, 64; 1996, Internaitonal School of Crystallography: 23rd Course, X-Ray and Neutfon Dynamical Diffraction: Theory and Applications, April 9-12, Erice, Italy, p. 287.
9. Gay, P., Hirsch, P. B., and Kelly, A., 1953, Acta melali., 1, 315.
10. Hordon, M. J., and Averbach, B. L., 1961, Acta metall., 9, 237.
11. Lei, T., Ludwig, K. F., Jr, and Moustakas, T. D., 1993, J. appl. Phys., 74, 4430.
12. Lester, S. D., Ponce, F. A., Craford, M. G., and Steigerwald, D. A., 1995, Appl. Phys. Lett., 66, 1249.
13. Matsushita, T., Kikuta, S., and Kohra, K., 1971, J. Phys. Soc. Japan, 30, 1136.
14. Ning, X. J., Chien, F. R., Priouz, P., Yang, J. W., and Khan, M. A., 1996, J. Mater. Res., 11, 580.
15. Ponce, F. A., 1997, MRS Bull., 22, 51.
16. Qadri, S. B., and Dinan, J. H., 1985, Appl. Phys. Lett., 47, 1066.
17. Scherrer, P., 1918, Gott. Nachrichten, 2, 98.
18. Schoening, F. R. L., 1965, Acta crystallogr., 18, 975.
19. Schuster, M., and Göbel, H., 1995, J. Phys. D, 28, A270; 1995, J. Phys. D, 29, 1677.
20. Stehle, H., and Seeger, A., 1956, Z. Phys., 146, 217.
21. Stokes, A. R., and Wilson, A. J. C., 1994, Proc. Phys. Soc., 56, 174.
22. Voigt, W., 1912, Sitzungsber. K. Bayer. Akad. Wiss., 42, 603.
23. Warren, B. E., 1969, X-Ray Diffraction (Reading, MA: Addison-Wesley).
24. Williamson, G. K., and Hall, W. H., 1953, Acta metall., 1, 22.