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Volumn 95, Issue 20, 2009, Pages

Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

BULK ELECTRONS; ELECTRON ACCUMULATION; ELECTRON CONFINEMENT; FREE ELECTRON; INFRARED ELLIPSOMETRY; INN FILMS; MOBILITY PARAMETERS; NON-POLAR; SEMIPOLAR; SURFACE ELECTRON; SURFACE ELECTRON ACCUMULATION; SURFACE ORIENTATION; UPPER LIMITS; WURTZITES;

EID: 70549101089     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3261731     Document Type: Article
Times cited : (28)

References (18)
  • 6
    • 34247863807 scopus 로고    scopus 로고
    • Microscopic origins of surface states on nitride surfaces
    • DOI 10.1063/1.2722731
    • C. G. Van de Walle and D. Segev, J. Appl. Phys. 0021-8979 101, 081704 (2007). 10.1063/1.2722731 (Pubitemid 46691125)
    • (2007) Journal of Applied Physics , vol.101 , Issue.8 , pp. 081704
    • Van De Walle, C.G.1    Segev, D.2
  • 18
    • 0032181962 scopus 로고    scopus 로고
    • 0022-3727,. 10.1088/0022-3727/31/20/001
    • O. Ambacher, J. Phys. D: Appl. Phys. 0022-3727 31, 2653 (1998). 10.1088/0022-3727/31/20/001
    • (1998) J. Phys. D: Appl. Phys. , vol.31 , pp. 2653
    • Ambacher, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.