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Volumn 292, Issue 2, 2006, Pages 542-545

Study on Czochralski growth and defects of LiAlO2 single crystals

Author keywords

A1. Etch pit density; A2. Czochralski method; B1. LiAlO2

Indexed keywords

CRYSTAL DEFECTS; ETCHING; LITHIUM COMPOUNDS; OPTICAL MICROSCOPY; PRESSURE EFFECTS; SINGLE CRYSTALS;

EID: 33745858659     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.04.061     Document Type: Article
Times cited : (12)

References (7)
  • 3
    • 33745829531 scopus 로고    scopus 로고
    • D.M. Follstaedt, J. Han, P. Provencio, J.G. Fleming, MRS Internet J. Nitride Semicond. Res. 4S1 G3.72 (1999).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.