Young's modulus measurement of thin films by resonant frequency method using magnetostrictive resonator

Computers, Materials and Continua

Volumn 13, Issue 3, 2010, Pages 235-248

  Zhou, Hao Miao ^a   Li, Fang ^a   Ye, Qiang ^a   Zhao, Ji Xiang ^a   Xia, Zhe Lei ^a   Tang, Ying ^a   Wei, Jing ^b  

^a CHINA JILIANG UNIVERSITY   (China)

^b ZHEJIANG GONGSHANG UNIVERSITY   (China)

Author keywords

Magnetostrictvie resonator; Resonant frequency method; Young's modulus of thin film

Indexed keywords

ASSESSING METHOD; BEFORE AND AFTER; EXTERNAL MAGNETIC FIELD; FIRST-ORDER; LAMINATED PLATE THEORY; NON DESTRUCTIVE; RESONANT FREQUENCIES; RESONANT FREQUENCY SHIFT; SIC MATERIALS; STANDARD MEASUREMENTS; YOUNG'S MODULUS; YOUNG'S MODULUS OF THIN FILM;

CHROMIUM; DEPOSITION; ELASTICITY; FILM THICKNESS; MAGNETIC FIELDS; MAGNETOSTRICTIVE DEVICES; NATURAL FREQUENCIES; RESONATORS; SILICON CARBIDE; THIN FILMS;

ELASTIC MODULI;

EID: 77951440092     PISSN: 15462218     EISSN: 15462226     Source Type: Journal    
DOI: None     Document Type: Article

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