Determination of Young's modulus by a resonant technique applied to two dynamically ion mixed thin films

Thin Solid Films

Volumn 292, Issue 1-2, 1997, Pages 55-60

  Peraud, S ^a   Pautrot, S ^a   Villechaise, P ^a   Mazot, P ^a   Mendez, J ^a  

^a CNRS   (France)

Author keywords

Dynamic ion mixing; Resonant technique; Young's modulus

Indexed keywords

CALCULATIONS; COATINGS; ELASTIC MODULI; EVAPORATION; INTERNAL FRICTION; ION IMPLANTATION; IONS; MIXING; NICKEL ALLOYS; SILICON CARBIDE;

ANISOTROPIC MATERIALS; DYNAMIC ION MIXING; ELASTIC CONSTANTS; ION SPUTTERING EVAPORATION; ISOTROPIC MATERIALS; NICKEL TITANIUM ALLOYS; RESONANT TECHNIQUE;

THIN FILMS;

EID: 0031553478     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08998-5     Document Type: Article

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