SCOPUS 정보 검색 플랫폼

Analytical and Bioanalytical Chemistry

Volumn 396, Issue 8, 2010, Pages 2757-2768

Non-destructive depth compositional profiles by XPS peak-shape analysis

(4) Lopez Santos M C a Yubero, F a Espinos J P a Gonzalez Elipe A R a

a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA (Spain)

Author keywords

Depth profiling; Film growth; Plasma treatment; Surface analysis; XPS

Indexed keywords

DEPTH DISTRIBUTION; ELECTRON TRANSPORT; NON DESTRUCTIVE; PEAK SHAPES; PLASMA TREATMENT; POLYMER SURFACES; SHAPE ANALYSIS; THEORETICAL BASIS; XPS;

DEPTH PROFILING; PHOTOIONIZATION; PHOTONS; PLASMA APPLICATIONS; STATISTICAL MECHANICS; SURFACE ANALYSIS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM GROWTH;

EID: 77951296977 PISSN: 16182642 EISSN: 16182650 Source Type: Journal
DOI: 10.1007/s00216-009-3312-9 Document Type: Review

Times cited : (22)

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