Interface effects in the Ni 2p x-ray photoelectron spectra of NiO thin films grown on oxide substrates

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 7, 2008, Pages

  Preda, I ^a   Gutierrez A ^a   Abbate, M ^b   Yubero, F ^c   Mendez J ^d   Alvarez, L ^d   Soriano, L ^a  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^c UNIVERSITY OF SEVILLE   (Spain)

^d INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 40949142439     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.075411     Document Type: Article

References (33)

1. L. Soriano, A. Gutiérrez, I. Preda, S. Palacín, J. M. Sanz, M. Abbate, J. F. Trigo, A. Vollmer, and P. R. Bressler, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.74.193402 74, 193402 (2006).
2. L. Soriano, I. Preda, A. Gutiérrez, S. Palacín, M. Abbate, and A. Vollmer, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.75.233417 75, 233417 (2007).
3. A. Fujimori, F. Minami, and S. Sugano, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.29.5225 29, 5225 (1984).
4. G. A. Sawatzky and J. W. Allen, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.53.2339 53, 2339 (1984).
5. S. Hüfner, Solid State Commun. SSCOA4 0038-1098 10.1016/0038- 1098(84)90007-3 52, 793 (1984).
6. M. A. van Veenendaal and G. A. Sawatzky, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.70.2459 70, 2459 (1993).
7. P. Kuiper, G. Kruizinga, J. Ghijsen, G. A. Sawatzky, and H. Verweij, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.62.221 62, 221 (1989).
8. M. Abbate, F. M. F. de Groot, J. C. Fuggle, A. Fujimori, Y. Tokura, Y. Fujishima, O. Strebel, M. Domke, G. Kaindl, J. van Elp, B. T. Thole, G. A. Sawatzky, M. Sacchi, and N. Tsuda, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.44.5419 44, 5419 (1991).
9. D. Alders, F. C. Voogt, T. Hibma, and G. A. Sawatzky, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.7716 54, 7716 (1996).
10. L. Sangaletti, L. E. Depero, and F. Parmigiani, Solid State Commun. SSCOA4 0038-1098 10.1016/S0038-1098(97)00185-3 103, 421 (1997).
11. G. H. Vurens, M. Salmerón, and G. A. Somorjai, Prog. Surf. Sci. PSSFBP 0079-6816 10.1016/0079-6816(89)90006-3 32, 333 (1990).
12. V. E. Henrich, Prog. Surf. Sci. PSSFBP 0079-6816 10.1016/0079-6816(95) 00046-1 50, 77 (1995).
13. V. E. Henrich and P. A. Cox, The Surface Science of Metal Oxides (Cambridge University Press, Cambridge, England, 1994), Chap..
14. R. J. Lad, Surf. Rev. Lett. SRLEFH 0218-625X 2, 109 (1995).
15. A. R. González-Elipe and F. Yubero, in Handbook of Surfaces and Interfaces of Materials, edited by, H. S. Nalwa, (Academic, San Diego, 2001), Chap..
16. A. Corrias, G. Mountjoy, G. Piccaluga, and S. Solinas, J. Phys. Chem. B JPCBFK 1089-5647 10.1021/jp9927911 103, 10081 (1999).
17. X. J. Zhang, J. X. Liu, Y. Jing, and Y. C. Xie, Appl. Catal., A ACAGE4 0926-860X 10.1016/S0926-860X(02)00428-3 240, 1 (2003).
18. M. Nurunnabi, B. T. Li, K. Kunimori, K. Suzuki, K. Fujimoto, and K. Tomishige, Catal. Lett. CALEER 1011-372X 103, 277 (2005).
19. S. D. Peacor and T. Hibma, Surf. Sci. SUSCAS 0039-6028 10.1016/0039-6028(94)91283-1 301, 11 (1994).
20. J. M. Sanz and G. Tyliev, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039-6028(96)00818-7 367, 196 (1996).
21. J. M. Sanz, L. Soriano, P. Prieto, G. Tyuliev, C. Morant, and E. Elizalde, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(98)01058-X 332, 209 (1998).
22. M. A. James and T. Hibma, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039-6028(99)00476-8 433, 718 (1999).
23. B. Warot, E. Snoek, J. C. Ousset, M. J. Casanove, S. Dubourg, and J. F. Bobo, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/S0169-4332(01)00725-5 188, 151 (2002).
24. L. Soriano, G. G. Fuentes, C. Quirós, J. F. Trigo, J. M. Sanz, P. R. Bressler, and A. R. González-Elipe, Langmuir LANGD5 0743-7463 10.1021/la000330x 16, 7066 (2000).
25. M. Sánchez-Agudo, L. Soriano, C. Quirós, M. Abbate, L. Roca, J. Avila, and J. M. Sanz, Langmuir LANGD5 0743-7463 10.1021/la010868i 17, 7339 (2001).
26. S. Tougaard, QUASES, Software package for quantitative XPS/AES of surface nanostructures by inelastic peak shape analysis, see www.QUASES.com
27. I. Preda, M. Abbate, A. Gutiérrez, S. Palacín, A. Vollmer, and L. Soriano, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 156-158, 111 (2007).
28. I. Horcas, R. Fernández, J. M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero, and A. M. Baró, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.2432410 78, 013705 (2007).
29. S. Tougaard, Surf. Interface Anal. SIANDQ 0142-2421 10.1002/(SICI)1096- 9918(199804)26:4<249::AID-SIA368>3.0.CO;2-A 26, 249 (1998).
30. M. D. Towler, N. M. Harrison, and M. I. McCarthy, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.52.5375 52, 5375 (1995).
31. G. van der Laan, C. Westra, C. Haas, and G. A. Sawatzky, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.23.4369 23, 4369 (1981).
32. G. Zampieri, F. Prado, A. Caneiro, J. Briatico, M. T. Causa, M. Tovar, B. Alascio, M. Abbate, and E. Morikawa, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.58.3755 58, 3755 (1998).
33. G. Lassaleta, A. Fernández, J. P. Espinós, and A. R. González-Elipe, J. Phys. Chem. JPCHAX 0022-3654 10.1021/j100005a019 99, 1484 (1995).