Quantification and IMFP determination of multilayer Langmuir-Blodgett films by AFM and XPS measurements

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 604-609

  Sato, Masahide ^a   Tsukamoto, Naoto ^a   Shiratori, Tsubasa ^a   Furusawa, Takeshi ^a   Suzuki, Noboru ^a   Tougaard, Sven ^b  

^a UTSUNOMIYA UNIVERSITY   (Japan)

^b UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

AFM; ARXPS; Langmuir Blodgett films; Tougaard method; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; LANGMUIR BLODGETT FILMS; MONOLAYERS; ORGANIC MINERALS; SILICON; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

AFM; ARXPS; INELASTIC MEAN FREE PATHS (IMFP); TOUGAARD METHOD;

THICK FILMS;

EID: 33646585812     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2278     Document Type: Conference Paper

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