Characterization of Langmuir- Blodgett film using differential charging in X-ray photoelectron spectroscopy

Journal of Physical Chemistry B

Volumn 112, Issue 29, 2008, Pages 8523-8529

  Maidul Islam, A K M ^a   Mukherjee, M ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; ELECTRON SPECTROSCOPY; HYDROCARBONS; LITHOGRAPHY; MOLECULAR BEAM EPITAXY; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; MULTILAYER FILMS; MULTILAYERS; NONMETALS; ORGANIC COMPOUNDS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; SILICON; SPECTRUM ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED XPS; DIFFERENTIAL CHARGING; LB FILMS; LINE SHIFTING; MONO- AND MULTILAYER; MULTI LAYERING; NEUTRALIZATION TECHNIQUES; POSITIVE CHARGES; QUALITY DATA; QUANTITATIVE INFORMATION; SILICON SUBSTRATES; UPPER LAYERS; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

LANGMUIR BLODGETT FILMS;

EID: 49149125142     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp801942z     Document Type: Article

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