SCOPUS 정보 검색 플랫폼

Volumn 26, Issue 2, 2010, Pages 165-176

Surface excitations in surface electron spectroscopies studied by reflection electron energy-loss spectroscopy and elastic peak electron spectroscopy

(2) Nagatomi, Takaharu a Tanuma, Shigeo b

a OSAKA UNIVERSITY (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DISSOCIATION; ELECTRIC EXCITATION; ELECTRON EMISSION; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; INELASTIC SCATTERING; KINETIC ENERGY; KINETICS; PHOTOELECTRON SPECTROSCOPY; SPECTRUM ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DIELECTRIC FUNCTIONS; ELASTIC PEAK ELECTRON SPECTROSCOPY; EXPERIMENTAL DETERMINATION; INELASTIC MEAN FREE PATH; INELASTIC SCATTERING PROCESS; PREDICTIVE EQUATIONS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; SURFACE EXCITATION PARAMETERS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77949880014 PISSN: 09106340 EISSN: 13482246 Source Type: Journal
DOI: 10.2116/analsci.26.165 Document Type: Review

Times cited : (3)

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