Absolute determination of inelastic mean-free paths and surface excitation parameters by absolute reflection electron energy loss spectrum analysis

Applied Physics Letters

Volumn 87, Issue 22, 2005, Pages 1-3

  Nagatomi, T ^a,b   Goto, K ^b  

^a OSAKA UNIVERSITY   (Japan)

^b NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; HIGH ENERGY PHYSICS; LIGHT REFLECTION; NICKEL; NONLINEAR EQUATIONS;

CHEN-TYPE EMPIRICAL FORMULA; INELASTIC MEAN-FREE PATH (IMFP); MEDIUM-ENERGY ELECTRONS; SURFACE EXCITATION PARAMETERS (SEP);

ELECTRON TRANSITIONS;

EID: 27944511408     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2135211     Document Type: Article

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