New energy loss functions for 1 keV electrons incident on clean and oxygen-adsorbed Si (111) surfaces

Surface Science

Volumn 416, Issue 1-2, 1998, Pages 184-191

  Nagatomi, Takaharu ^a   Kawano, Takashi ^a   Fujii, Hideo ^b   Kusumoto, Eisuke ^b   Shimizu, Ryuichi ^a  

^a OSAKA UNIVERSITY   (Japan)

^b KOBE STEEL LTD   (Japan)

Author keywords

Electron energy loss spectroscopy (EELS); Electron solid scattering and transmission elastic; Electron solid scattering and transmission inelastic; Photoelectron spectroscopy; Silicon; Silicon oxides

Indexed keywords

ADSORPTION; CALCULATIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; OXYGEN; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY LOSS FUNCTIONS; LANDAU THEORY;

SEMICONDUCTING SILICON;

EID: 0032181055     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00579-2     Document Type: Article

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