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Volumn 34, Issue 1, 2002, Pages 206-210
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Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter
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Author keywords
EPES; IMFP; Surface excitation
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
ELECTROLYSIS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
GERMANIUM;
ION BOMBARDMENT;
MAGNETRON SPUTTERING;
SCANNING TUNNELING MICROSCOPY;
SILVER;
SURFACE CLEANING;
SURFACE ROUGHNESS;
TIN;
ELASTIC PEAK ELECTRON SPECTROSCOPY;
INELASTIC MEAN FREE PATH;
SURFACE EXCITATION PARAMETER;
SURFACE STRUCTURE;
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EID: 0036693794
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.1284 Document Type: Conference Paper |
Times cited : (20)
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References (26)
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