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Volumn 34, Issue 1, 2002, Pages 206-210

Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter

Author keywords

EPES; IMFP; Surface excitation

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTROLYSIS; ELECTRON ENERGY LOSS SPECTROSCOPY; GERMANIUM; ION BOMBARDMENT; MAGNETRON SPUTTERING; SCANNING TUNNELING MICROSCOPY; SILVER; SURFACE CLEANING; SURFACE ROUGHNESS; TIN;

EID: 0036693794     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1284     Document Type: Conference Paper
Times cited : (20)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.