Experimental measurements of the surface excitation parameters of Cu, Au, Ni, Ag, Ge and Pd based on Si and other reference standard materials

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 1098-1101

  Gergely, G ^a   Menyhard, M ^a   Gurban, S ^a   Toth, J ^b   Varga, D ^b  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

Author keywords

Standard elements: Elastic peak electron spectroscopy; Surface excitation

Indexed keywords

ELASTIC PEAK ELECTRON SPECTROSCOPY; STANDARD ELEMENTS; SURFACE EXCITATION; SURFACE LOSSES;

BACKSCATTERING; ELECTRON SPECTROSCOPY; ERRORS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; SILICON; SPECTROMETERS;

SURFACE STRUCTURE;

EID: 4444259647     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1849     Document Type: Conference Paper

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