Determination of effective energy loss functions and x-ray photoelectron spectroscopy source functions for Si 2p photoelectrons from clean Si(111), oxygen-adsorbed Si(111) and SiO2 surfaces

Journal of Applied Physics

Volumn 83, Issue 12, 1998, Pages 8016-8026

  Nagatomi, Takaharu ^a   Kawano, Takashi ^a   Shimizu, Ryuichi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013405843     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367894     Document Type: Article

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