Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 15, 2008, Pages

  Hajati, Shaaker ^a,b   Romanyuk, Oleksandr ^c   Zemek, Josef ^c   Tougaard, Sven ^a  

^a UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

^b YASOUJ UNIVERSITY   (Iran)

^c INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 41549142209     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.155403     Document Type: Article

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