Derivation of new energy-loss functions as applied to analysis of Si 2p XPS spectra

Surface Science

Volumn 359, Issue 1-3, 1996, Pages 163-173

  Nagotomi, Takaharu ^a   Ding, Ze Jun ^b   Shimizu, Ryuichi ^a  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Amorphous surfaces; Computer simulations; Electron energy loss spectroscopy; Electron solid interactions; Silicon; X ray photoelectron spectroscopy

Indexed keywords

COMPUTER SIMULATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRON TRANSITIONS; ELECTRONIC STRUCTURE; MONTE CARLO METHODS; SILICON; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS SURFACES; BULK PLASMON EXCITATIONS; ELASTIC SCATTERING; ELECTRON SOLID INTERACTIONS; ENERGY LOSS FUNCTIONS; LANDAU FORMULATION; PHOTOELECTRONS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPY; SIGNAL CHARACTERISTICS;

ELECTRONIC DENSITY OF STATES;

EID: 0030190928     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00366-4     Document Type: Article

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