Evaluation of electron inelastic mean free paths for selected elements and compounds

Surface and Interface Analysis

Volumn 29, Issue 2, 2000, Pages 108-114

  Powell, C J ^a   Jablonski, A ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ELECTRON SCATTERING; IRON; MOLYBDENUM; PLATINUM; POLYBUTENES; POLYETHYLENES; POLYSTYRENES; POTASSIUM COMPOUNDS; SILICA; TUNGSTEN; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON INELASTIC MEAN FREE PATH (IMFP);

SURFACE PHENOMENA;

EID: 0033896710     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(200002)29:2<108::AID-SIA700>3.0.CO;2-4     Document Type: Article

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