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Volumn 21, Issue 11, 2010, Pages
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Electron beam induced current measurements on single-walled carbon nanotube devices
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Author keywords
[No Author keywords available]
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Indexed keywords
DIRECT INTERACTIONS;
ELECTRICAL CONTACTS;
ELECTRICAL PROPERTY;
ELECTRON BEAM BOMBARDMENT;
ELECTRON-BEAM-INDUCED CURRENT;
EXCESS CARRIERS;
INSULATING SURFACES;
METAL CONTACTS;
METAL ELECTRODES;
SINGLE-WALLED CARBON;
CARBON NANOTUBES;
ELECTRIC CURRENT MEASUREMENT;
ELECTRIC PROPERTIES;
ELECTRODES;
ELECTRON BEAMS;
ELECTRONS;
SINGLE-WALLED CARBON NANOTUBES (SWCN);
ELECTRIC CURRENTS;
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EID: 77349110030
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/21/11/115706 Document Type: Article |
Times cited : (10)
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References (23)
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