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Volumn 21, Issue 11, 2010, Pages

Electron beam induced current measurements on single-walled carbon nanotube devices

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT INTERACTIONS; ELECTRICAL CONTACTS; ELECTRICAL PROPERTY; ELECTRON BEAM BOMBARDMENT; ELECTRON-BEAM-INDUCED CURRENT; EXCESS CARRIERS; INSULATING SURFACES; METAL CONTACTS; METAL ELECTRODES; SINGLE-WALLED CARBON;

EID: 77349110030     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/11/115706     Document Type: Article
Times cited : (10)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.