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Volumn 42, Issue 1-3, 1996, Pages 14-23

EBIC studies of grain boundaries

Author keywords

Grain boundaries; Peak and trough form; Polycrystalline ZnSe

Indexed keywords

BOUNDARY LAYERS; CHARGE CARRIERS; CRYSTAL DEFECTS; ELECTRON BEAMS; INDUCED CURRENTS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR DOPING; THERMAL EFFECTS; ZINC COMPOUNDS;

EID: 0005143088     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(96)01678-9     Document Type: Article
Times cited : (31)

References (17)
  • 1
    • 0041615543 scopus 로고
    • J.H. Werner and H.P. Strunk (eds.), Proc. 2nd Int. Conf. Polycrystalline Semiconductors II, Schwabisch Hall, Germany, 30 July-3 August, 1990, Springer-Verlag, Berlin
    • B. Raza and D.B. Holt, in J.H. Werner and H.P. Strunk (eds.), Proc. 2nd Int. Conf. Polycrystalline Semiconductors II, Schwabisch Hall, Germany, 30 July-3 August, 1990, Springer Proc. in Phys. Vol. 54, Springer-Verlag, Berlin, 1991, p. 72.
    • (1991) Springer Proc. in Phys. , vol.54 , pp. 72
    • Raza, B.1    Holt, D.B.2
  • 8
    • 0043118319 scopus 로고
    • Proc. IoP conf. microscopy of semiconducting materials, Oxford, 20-23 March, 1995
    • Inst. Phys., Bristol
    • B. Raza and D.B. Holt, Proc. IoP Conf. Microscopy of Semiconducting Materials, Oxford, 20-23 March, 1995, Conf. Series No. 146, Inst. Phys., Bristol, 1995, p. 107.
    • (1995) Conf. Series No. 146 , vol.146 , pp. 107
    • Raza, B.1    Holt, D.B.2
  • 11
    • 0003158486 scopus 로고
    • Proc. IoP conf. microscopy of semiconducting materials, Oxford, 6-8 April, 1987
    • Inst. Phys., Bristol
    • E. Napchan and D.B. Holt, Proc. IoP Conf. Microscopy of Semiconducting Materials, Oxford, 6-8 April, 1987, Conf. Series No. 87, Inst. Phys., Bristol, 1987, p. 733.
    • (1987) Conf. Series No. 87 , vol.87 , pp. 733
    • Napchan, E.1    Holt, D.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.