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Volumn 42, Issue 1-3, 1996, Pages 14-23
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EBIC studies of grain boundaries
a
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Author keywords
Grain boundaries; Peak and trough form; Polycrystalline ZnSe
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Indexed keywords
BOUNDARY LAYERS;
CHARGE CARRIERS;
CRYSTAL DEFECTS;
ELECTRON BEAMS;
INDUCED CURRENTS;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING SELENIUM COMPOUNDS;
SEMICONDUCTOR DOPING;
THERMAL EFFECTS;
ZINC COMPOUNDS;
DOPING DENSITY;
ELECTRON BACKSCATTERING PATTERNS (EBSP);
REMOTE ELECTRON BEAM INDUCED CURRENT (REBIC);
ZINC SELENIDE;
GRAIN BOUNDARIES;
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EID: 0005143088
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(96)01678-9 Document Type: Article |
Times cited : (31)
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References (17)
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