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Volumn 7, Issue 11, 2007, Pages 3320-3323

Photocurrent imaging of p-n junctions in ambipolar carbon nanotube transistors

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE TRANSISTORS; OPTOELECTRONIC PROPERTIES; PHOTOCURRENT IMAGING; SCANNING PHOTOCURRENT MICROSCOPY (SPCM);

EID: 36749087584     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl071536m     Document Type: Article
Times cited : (101)

References (21)
  • 2
    • 3042681293 scopus 로고    scopus 로고
    • Avouris, P. MRS Bull. 2004, 29, 403-410.
    • (2004) MRS Bull , vol.29 , pp. 403-410
    • Avouris, P.1
  • 3
  • 13
    • 23144434345 scopus 로고    scopus 로고
    • Ahn, Y.; J., D.; Park, J. Nano Lett. 2005, 5, 1367-1370.
    • Ahn, Y.; J., D.; Park, J. Nano Lett. 2005, 5, 1367-1370.
  • 16
    • 36749089778 scopus 로고    scopus 로고
    • Quantitative details of the band alignment parameters discussed here will change for different CNT devices, depending on various conditions such as the bandgap of CNT, the metal work function, and/or the electrostatic environment near the contacts. Our SPCM technique will allow a systematic study on the effect of these conditions on the band parameters, which is outside the scope of this paper
    • Quantitative details of the band alignment parameters discussed here will change for different CNT devices, depending on various conditions such as the bandgap of CNT, the metal work function, and/or the electrostatic environment near the contacts. Our SPCM technique will allow a systematic study on the effect of these conditions on the band parameters, which is outside the scope of this paper.
  • 21
    • 36749071810 scopus 로고    scopus 로고
    • All of our partially suspended CNT devices we tested show the relative p-doping in the suspended part of CNTs. This is likely due to the acid (HF) treatment that only the suspended part was exposed to during the fabrication of the trench. Even though the effect of HF on the CNT properties has not been investigated, a strong acid such as a nitric acid is routinely used for the oxidation of CNTs
    • All of our partially suspended CNT devices we tested show the relative p-doping in the suspended part of CNTs. This is likely due to the acid (HF) treatment that only the suspended part was exposed to during the fabrication of the trench. Even though the effect of HF on the CNT properties has not been investigated, a strong acid such as a nitric acid is routinely used for the oxidation of CNTs.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.