-
2
-
-
3042681293
-
-
Avouris, P. MRS Bull. 2004, 29, 403-410.
-
(2004)
MRS Bull
, vol.29
, pp. 403-410
-
-
Avouris, P.1
-
3
-
-
0038781397
-
-
Lieber, C. M. MRS Bull. 2003, 28, 486-491.
-
(2003)
MRS Bull
, vol.28
, pp. 486-491
-
-
Lieber, C.M.1
-
4
-
-
0037009625
-
-
Heinze, S.; Tersoff, J.; Martel, R.; Derycke, V.; Appenzeller, J.; Avouris, P. Phys. Rev. Lett. 2002, 89, 106801.
-
(2002)
Phys. Rev. Lett
, vol.89
, pp. 106801
-
-
Heinze, S.1
Tersoff, J.2
Martel, R.3
Derycke, V.4
Appenzeller, J.5
Avouris, P.6
-
5
-
-
0037120521
-
-
Appenzeller, J.; Knoch, J.; Derycke, V.; Martel, R.; Wind, S.; Avouris, P. Phys. Rev. Lett. 2002, 89, 126801.
-
(2002)
Phys. Rev. Lett
, vol.89
, pp. 126801
-
-
Appenzeller, J.1
Knoch, J.2
Derycke, V.3
Martel, R.4
Wind, S.5
Avouris, P.6
-
6
-
-
2142649257
-
-
Javey, A.; Guo, J.; Paulsson, M.; Wang, Q.; Mann, D.; Lundstrom, M.; Dai, H. J. Phys. Rev. Lett. 2004, 92, 106804.
-
(2004)
Phys. Rev. Lett
, vol.92
, pp. 106804
-
-
Javey, A.1
Guo, J.2
Paulsson, M.3
Wang, Q.4
Mann, D.5
Lundstrom, M.6
Dai, H.J.7
-
7
-
-
1442307087
-
-
Yaish, Y.; Park, J. Y.; Rosenblatt, S.; Sazonova, V.; Brink, M.; McEuen, P. L. Phys. Rev. Lett. 2004, 92, 046401.
-
(2004)
Phys. Rev. Lett
, vol.92
, pp. 046401
-
-
Yaish, Y.1
Park, J.Y.2
Rosenblatt, S.3
Sazonova, V.4
Brink, M.5
McEuen, P.L.6
-
8
-
-
5444249586
-
-
Bachtold, A.; Fuhrer, M. S.; Plyasunov, S.; Forero, M.; Anderson, E. H.; Zettl, A.; McEuen, P. L. Phys. Rev. Lett. 2000, 84, 6082-6085.
-
(2000)
Phys. Rev. Lett
, vol.84
, pp. 6082-6085
-
-
Bachtold, A.1
Fuhrer, M.S.2
Plyasunov, S.3
Forero, M.4
Anderson, E.H.5
Zettl, A.6
McEuen, P.L.7
-
9
-
-
2142695812
-
-
Balasubramanian, K.; Fan, Y. W.; Burghard, M.; Kern, K.; Friedrich, M.; Wannek, U.; Mews, A. Appl. Phys. Lett. 2004, 84, 2400-2402.
-
(2004)
Appl. Phys. Lett
, vol.84
, pp. 2400-2402
-
-
Balasubramanian, K.1
Fan, Y.W.2
Burghard, M.3
Kern, K.4
Friedrich, M.5
Wannek, U.6
Mews, A.7
-
10
-
-
16244369081
-
-
Balasubramanian, K.; Burghard, M.; Kern, K.; Scolari, M.; Mews, A. Nano Lett. 2005, 5, 507-510.
-
(2005)
Nano Lett
, vol.5
, pp. 507-510
-
-
Balasubramanian, K.1
Burghard, M.2
Kern, K.3
Scolari, M.4
Mews, A.5
-
11
-
-
34547215275
-
-
Freitag, M.; Tsang, J. C.; Bol, A.; Yuan, D.; Liu, J.; Avouris, P. Nano Lett. 2007, 7, 2037-2042.
-
(2007)
Nano Lett
, vol.7
, pp. 2037-2042
-
-
Freitag, M.1
Tsang, J.C.2
Bol, A.3
Yuan, D.4
Liu, J.5
Avouris, P.6
-
12
-
-
23744464344
-
-
Gu, Y.; Kwak, E.-S.; Lensch, J. L.; Allen, J. E.; Odom, T. W.; Lauhon, L. J. Appl. Phys. Lett. 2005, 87, 043111.
-
(2005)
Appl. Phys. Lett
, vol.87
, pp. 043111
-
-
Gu, Y.1
Kwak, E.-S.2
Lensch, J.L.3
Allen, J.E.4
Odom, T.W.5
Lauhon, L.J.6
-
13
-
-
23144434345
-
-
Ahn, Y.; J., D.; Park, J. Nano Lett. 2005, 5, 1367-1370.
-
Ahn, Y.; J., D.; Park, J. Nano Lett. 2005, 5, 1367-1370.
-
-
-
-
14
-
-
33744811719
-
-
Gu, Y.; Romankiewicz, J. P.; David, J. K.; Lensch, J. L.; Lauhon, L. J. Nano Lett. 2006, 6, 948-952.
-
(2006)
Nano Lett
, vol.6
, pp. 948-952
-
-
Gu, Y.1
Romankiewicz, J.P.2
David, J.K.3
Lensch, J.L.4
Lauhon, L.J.5
-
15
-
-
0013068352
-
-
Rosenblatt, S.; Yaish, Y.; Park, J.; Gore, J.; Sazonova, V.; McEuen, P. L. Nano Lett. 2002, 2, 869-872.
-
(2002)
Nano Lett
, vol.2
, pp. 869-872
-
-
Rosenblatt, S.1
Yaish, Y.2
Park, J.3
Gore, J.4
Sazonova, V.5
McEuen, P.L.6
-
16
-
-
36749089778
-
-
Quantitative details of the band alignment parameters discussed here will change for different CNT devices, depending on various conditions such as the bandgap of CNT, the metal work function, and/or the electrostatic environment near the contacts. Our SPCM technique will allow a systematic study on the effect of these conditions on the band parameters, which is outside the scope of this paper
-
Quantitative details of the band alignment parameters discussed here will change for different CNT devices, depending on various conditions such as the bandgap of CNT, the metal work function, and/or the electrostatic environment near the contacts. Our SPCM technique will allow a systematic study on the effect of these conditions on the band parameters, which is outside the scope of this paper.
-
-
-
-
19
-
-
4644252328
-
-
Sazonova, V.; Yaish, Y.; Ustunel, H.; Roundy, D.; Arias, T. A.; McEuen, P. L. Nature 2004, 431, 284-287.
-
(2004)
Nature
, vol.431
, pp. 284-287
-
-
Sazonova, V.1
Yaish, Y.2
Ustunel, H.3
Roundy, D.4
Arias, T.A.5
McEuen, P.L.6
-
20
-
-
27944463073
-
-
Chen, J.; Perebeinos, V.; Freitag, M.; Tsang, J.; Fu, Q.; Liu, J.; Avouris, P. Science 2005, 310, 1171-1174.
-
(2005)
Science
, vol.310
, pp. 1171-1174
-
-
Chen, J.1
Perebeinos, V.2
Freitag, M.3
Tsang, J.4
Fu, Q.5
Liu, J.6
Avouris, P.7
-
21
-
-
36749071810
-
-
All of our partially suspended CNT devices we tested show the relative p-doping in the suspended part of CNTs. This is likely due to the acid (HF) treatment that only the suspended part was exposed to during the fabrication of the trench. Even though the effect of HF on the CNT properties has not been investigated, a strong acid such as a nitric acid is routinely used for the oxidation of CNTs
-
All of our partially suspended CNT devices we tested show the relative p-doping in the suspended part of CNTs. This is likely due to the acid (HF) treatment that only the suspended part was exposed to during the fabrication of the trench. Even though the effect of HF on the CNT properties has not been investigated, a strong acid such as a nitric acid is routinely used for the oxidation of CNTs.
-
-
-
|