Rapid imaging of nanotubes on insulating substrates

Applied Physics Letters

Volumn 81, Issue 13, 2002, Pages 2454-2456

  Brintlinger, T ^a   Chen, Yung Fu ^a   Durkop T ^a   Cobas, Enrique ^a   Fuhrer, M S ^a   Barry, John D ^b   Melngailis, John ^b  

^a Bldg 142   (United States)

^b Institute for Research in Electronics and Applied Physics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CONNECTIVITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; IMAGE CONTRASTS; INSULATING SUBSTRATES; POTENTIAL DIFFERENCE; RAPID IMAGING;

CARBON NANOTUBES; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SURFACE DEFECTS; SURFACE ROUGHNESS;

SUBSTRATES;

EID: 79956052237     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1509113     Document Type: Article

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