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Volumn 46, Issue 17, 1998, Pages 6227-6235

Depth resolved conductive mode imaging of varistor grain boundaries

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLOGRAPHY; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; ZINC OXIDE;

EID: 0032476299     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00244-4     Document Type: Article
Times cited : (8)

References (20)
  • 9
    • 0001102321 scopus 로고
    • Palm, J. and Alexander, H., J. Phys. IV, Colloq. C6, Supplement to J. Phys. III, 1991, 1, 101.
    • (1991) J. Phys. III , vol.1 , pp. 101
  • 12
    • 85033928117 scopus 로고
    • Ph.D. thesis, University of London, U.K.
    • Russell, J. D., Ph.D. thesis, University of London, U.K., 1990.
    • (1990)
    • Russell, J.D.1
  • 19
    • 85033933416 scopus 로고
    • Riccione, Italy, October 1995, ed. G. Gusamano and E. Traversa. Gruppo Editoriale Faenza Editrice, Faenza, Italy
    • Russell, J. D., Halls, D. C. and Leach, C., in Proc. IVth Euro. Ceram. Soc. Conf., Riccione, Italy, October 1995, ed. G. Gusamano and E. Traversa. Gruppo Editoriale Faenza Editrice, Faenza, Italy, 1995.
    • (1995) Proc. IVth Euro. Ceram. Soc. Conf.
    • Russell, J.D.1    Halls, D.C.2    Leach, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.