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Volumn 267, Issue 17, 2009, Pages 2839-2845

Defect engineering and micromachining of Lithium Niobate by ion implantation

Author keywords

Defect engineering; Ion implantation; Lithium Niobate; Micromachining

Indexed keywords

ATOMIC NUMBERS; CHEMICAL ETCHING; DAMAGE FORMATION; DEFECT ENGINEERING; ELECTRONIC PROCESS; ETCHING RATE; LITHIUM NIOBATE; ROOM TEMPERATURE; SEMIEMPIRICAL EQUATION; SUBTHRESHOLD; TEST PROCESS;

EID: 68949137023     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.06.105     Document Type: Article
Times cited : (28)

References (56)
  • 41
    • 0003987941 scopus 로고
    • Feldmann L.C., Mayer J.W., and Picraux S.T. (Eds), Academic Press, New York
    • In: Feldmann L.C., Mayer J.W., and Picraux S.T. (Eds). Material Analysis by Ion Channeling (1982), Academic Press, New York
    • (1982) Material Analysis by Ion Channeling
  • 44
    • 68949157211 scopus 로고    scopus 로고
    • J.F. Ziegler, J.P. Biersack, U. Littmark (Eds.), The Stopping and Ranges of Ions in Solids, Pergamon, New York, 1985, see also the SRIM web page http://www.srim.org.
    • J.F. Ziegler, J.P. Biersack, U. Littmark (Eds.), The Stopping and Ranges of Ions in Solids, Pergamon, New York, 1985, see also the SRIM web page http://www.srim.org.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.