Dynamic Surface Force Measurement. 2. Friction and the Atomic Force Microscope

Langmuir

Volumn 15, Issue 2, 1999, Pages 553-563

  Attard, Phil ^a   Carambassis, Archie ^b   Rutland, Mark W ^b  

^a UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

SURFACE FORCE MEASUREMENT;

ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; FRICTION; GLASS; HYSTERESIS; INTERFEROMETRY; MATHEMATICAL MODELS; SILICON;

VAN DER WAALS FORCES;

EID: 0032761049     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980848p     Document Type: Article

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