Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI

Nanotechnology

Volumn 14, Issue 12, 2003, Pages 1279-1288

  Cumpson, Peter J ^a   Hedley, John ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MEMBRANES; MOLECULAR DYNAMICS; MOLECULES; NANOSTRUCTURED MATERIALS; POLYMERS; PROTEINS; SURFACES; VELOCITY MEASUREMENT;

DOPPLER VELOCIMETRY; TRACEABILITY;

ATOMIC FORCE MICROSCOPY;

EID: 0345763129     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/14/12/009     Document Type: Article

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