SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force

Review of Scientific Instruments

Volumn 79, Issue 9, 2008, Pages

  Chung, Koo Hyun ^a   Scholz, Stefan ^a   Shaw, Gordon A ^a   Kramar, John A ^a   Pratt, Jon R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749116620     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2987695     Document Type: Article

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