Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: The nano force calibrator (NFC)

Metrologia

Volumn 43, Issue 5, 2006, Pages 389-395

  Kim, Min Seok ^a   Choi, Jae Hyuk ^a   Park, Yon Kyu ^a   Kim, Jong Ho ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; NANOTECHNOLOGY; PIEZOELECTRIC DEVICES; SENSITIVITY ANALYSIS; UNCERTAIN SYSTEMS;

BIOPHYSICS; CANTILEVER CALIBRATION DEVICE; NANO FORCE CALIBRATOR (NFC); QUANTIFIED FORCE METROLOGY;

FORCE MEASUREMENT;

EID: 33749446842     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/43/5/008     Document Type: Article

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