The NIST microforce realization and measurement project

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 508-511

  Newell, David B ^a   Kramar, John A ^a   Pratt, Jon R ^a   Smith, Douglas T ^a   Williams, Edwin R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Electrical standards; Force metrology; Mass metrology; Nanotechnology

Indexed keywords

CAPACITANCE MEASUREMENT; DIGITAL VOLTMETERS; ELECTROSTATICS; INTERFEROMETERS; METRIC SYSTEM; NANOTECHNOLOGY; VOLTAGE MEASUREMENT;

ELECTROMECHANICAL BALANCE; FORCE METROLOGY; MASS METROLOGY;

FORCE MEASUREMENT;

EID: 0038575711     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.810032     Document Type: Article

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