Molecular electronics at metal/semiconductor junctions. Si inversion by sub-nanometer molecular films

Nano Letters

Volumn 9, Issue 6, 2009, Pages 2390-2394

  Yaffe, Omer ^a   Scheres, Luc ^b   Puniredd, Sreenivasa Reddy ^c   Stein, Nir ^a   Biller, Ariel ^a   Lavan, Rotem Har ^a   Shpaisman, Hagay ^a   Zuilhof, Han ^b   Haick, Hossam ^c   Cahen, David ^a   Vilan, Ayelet ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b WAGENINGEN UNIVERSITY   (Netherlands)

^c TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ALKYL CHAIN LENGTHS; ELECTRON TRANSPORT; ELECTRONIC TRANSPORT; FORWARD BIAS; INTERFACE CONTROL; INTERFACE PROPERTY; MAJORITY CARRIERS; MOLECULAR FILMS; ORGANIC MOLECULES;

ALKYLATION; MOLECULAR ELECTRONICS; SEMICONDUCTING ORGANIC COMPOUNDS; THERMIONIC EMISSION;

SEMICONDUCTOR JUNCTIONS;

EID: 66749127327     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl900953z     Document Type: Article

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