Scanning tunneling microscopy of ethylated Si(111) surfaces prepared by a chlorination/alkylation process

Journal of Physical Chemistry B

Volumn 110, Issue 47, 2006, Pages 23898-23903

  Yu, Hongbin ^a   Webb, Lauren J ^a   Solares, Santiago D ^a   Cao, Peigen ^a   Goddard III, William A ^a   Heath, James R ^a   Lewis, Nathan S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINATION; COMPUTER SIMULATION; MOLECULAR DYNAMICS; SCANNING TUNNELING MICROSCOPY; SURFACE TREATMENT;

AVERAGE SPOT DENSITY; ETHYL-TERMINATED SI; MOLECULAR DYNAMICS SIMULATIONS; TETRAHYDROFURAN;

SILICON COMPOUNDS;

EID: 33846081919     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp063655g     Document Type: Article

References (26)

1. Bunimovitch, Y. L.; Ge, G.; Beverly, K. C.; Ries, R. S.; Hood, L.; Heath, J. R. Langmuir 2004, 20, 10630-10638.
2. Buriak, J. M. Chem. Rev. 2002, 102, 1271-1308.
3. Bent, S. F. Surf. Sci. 2002, 500, 879-903.
4. Wolkow, R. A. Annu. Rev. Phys. Chem. 1999, 50, 413-441.
5. Wayner, D. D. M.; Wolkow, R. A. J. Chem. Soc., Perkin Trans. 2 2002, 2, 23-34.
6. Bansal, A.; Lewis, N. S. J. Phys. Chem. B 1998, 102, 1067-1070.
7. Royea, W. J.; Juang, A.; Lewis, N. S. Appl. Phys. Lett. 2000, 77, 1988-1990.
8. Webb, L. J.; Lewis, N. S. J. Phys. Chem. B 2003, 107, 5404-5412.
9. Bansal, A.; Lewis, N. S. J. Phys. Chem. B 1998, 102, 4058-4060.
10. Webb, L. J.; Nemanick, E. J.; Biteen, J. S.; Knapp, D. W.; Michalak, D. J.; Traub, M. C.; Chan, A. S. Y.; Brunschwig, B. S.; Lewis, N. S. J. Phys. Chem. B 2005, 109, 3930-3937.
11. Hunger, R.; Fritsche, R.; Jaeckel, B.; Jaegermann, W.; Webb, L. J.; Lewis, N. S. Phys. Rev. B. 2005, 72, 045317.
12. Webb, L. J.; Rivillon, S.; Michalak, D. J.; Chabal, Y. J.; Lewis, N. S. J. Phys. Chem. B 2006, 110, 7349-7356.
13. Yu, H.; Webb, L. J.; Ries, R. S.; Solares, S. D.; Goddard, W. A.; Heath, J. R.; Lewis, N. S. J. Phys. Chem. B 2005, 109, 671-674.
14. Sieval, A. B.; van den Hout, B.; Sudholter, E. J. R. Langmuir 2000, 16, 2987-2990.
15. Sieval, A. B.; van den Hout, B., Zuilhof, H.; Sudholter, E. J. R. Langmuir 2001, 17, 2172-2181.
16. Bansal, A.; Li, X.; Yi, S. I.; Weinberg, W. H.; Lewis, N. S. J. Phys. Chem. B 2001, 105, 10266-10277.
17. Hines, M. A. Annu. Rev. Phys. Chem. 2003, 54, 29-56.
18. Schultz, P. A. SeqQuest Electronic Structure Code, http://dft.sandia.gov/ Quest/, Sandia National Laboratory, Albuquerque, NM.
19. Perdew, J. P.; Burke, K.; Ernzerhof, M. Phys. Rev. Lett. 1996, 77, 3865-3868.
20. Solares, S. D.; Yu, H.; Webb, L. J.; Lewis, N. S.; Heath, J. R.; Goddard, W. A. J. Am. Chem. Soc. 2006, 128, 3850-3851.
21. Itchkawitz, B. S.; McEllistrem, M. T.; Boland, J. J. Phys. Rev. Lett. 1997, 78, 98-101.
22. Nemanick, E. J.; Hurley, P. T.; Brunschwig, B. S.; Lewis, N. S. 2006, J. Phys. Chem. B, in press.
23. Shapiro, I. R.; Solares, S. D., Esplandiu, M. J.; Wade, L. A.; Goddard, W. A.; Collier, C. P. J. Phys. Chem. B 2004, 108, 13613-13618.
24. Mayo, S. L.; Olafson, B. D.; Goddard, W. A. J. Phys. Chem. 1990, 94, 8897-8909.
25. Yu, H.; Webb, L. J.; Lewis, N. S.; Heath, J. R. Appl. Phys. Lett. 2006, 88, 252111.
26. Miyadera, T.; Koma, A.; Shimada, T. Surf. Sci. 2003, 526, 177-183.