Quantitative analysis of scanning force microscopy data using harmonic models

Macromolecules

Volumn 42, Issue 4, 2009, Pages 1114-1124

  Schröter, Klaus ^a   Petzold, Albrecht ^a   Henze, Thomas ^a   Thurn Albrecht, Thomas ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL PARAMETERS; FORCE SPECTROSCOPY; FOURIER COEFFICIENTS; HARMONIC MODEL; HARMONIC OSCILLATORS; INTERACTION FORCES; INTERACTION PARAMETERS; INTERACTION PROCESS; INTERMITTENT CONTACT MODES; MEASURED DATA; NANOSTRUCTURED SURFACE; QUANTITATIVE ANALYSIS; SCANNING FORCE MICROSCOPY; SEMI-CRYSTALLINE POLYMER;

OSCILLATORS (ELECTRONIC); SCANNING TUNNELING MICROSCOPY;

POLYMERS;

EID: 66549108725     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma8024464     Document Type: Article

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