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Volumn 579, Issue 1, 2005, Pages 21-26
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Quantitative measurement of tip-sample forces by dynamic force spectroscopy in ambient conditions
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Author keywords
Adhesion; Atomic force microscopy
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Indexed keywords
ADHESION;
AMPLIFICATION;
FREQUENCY MODULATION;
HYSTERESIS;
OSCILLATIONS;
PHASE SHIFT;
POLYCARBONATES;
QUALITY CONTROL;
RESONANCE;
VACUUM APPLICATIONS;
CANTILEVER OSCILLATION;
DYNAMIC FORCE SPECTROSCOPY;
OSCILLATION AMPLITUDE;
POLYCARBONATE SUBSTRATE;
ATOMIC FORCE MICROSCOPY;
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EID: 14644401178
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.01.026 Document Type: Article |
Times cited : (19)
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References (21)
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