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Volumn 579, Issue 1, 2005, Pages 21-26

Quantitative measurement of tip-sample forces by dynamic force spectroscopy in ambient conditions

Author keywords

Adhesion; Atomic force microscopy

Indexed keywords

ADHESION; AMPLIFICATION; FREQUENCY MODULATION; HYSTERESIS; OSCILLATIONS; PHASE SHIFT; POLYCARBONATES; QUALITY CONTROL; RESONANCE; VACUUM APPLICATIONS;

EID: 14644401178     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.01.026     Document Type: Article
Times cited : (19)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.