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Volumn 21, Issue 22, 2009, Pages

In situ x-ray studies of native and Mo-seeded surface nanostructuring during ion bombardment of Si(100)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION-DRIVEN INSTABILITY; DYNAMIC SCALING; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; HIGH TEMPERATURE; IN-SITU; ION IMPACT; MASS REDISTRIBUTION; NANO-STRUCTURING; NANODOTS; NANORIPPLES; OFF-AXIS; PRIMARY EFFECTS; ROOM TEMPERATURE; SHORT WAVELENGTHS; SI SURFACES; SI(1 0 0); SI(100) SURFACE; SUBSTRATE TEMPERATURE; SURFACE CORRUGATIONS; SURFACE NANOSTRUCTURING; SURFACE SMOOTHING; THEORETICAL PREDICTION; X-RAY STUDIES;

EID: 66249084901     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/22/224008     Document Type: Article
Times cited : (45)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.