Multi-tip cones induced by ion-bombardment

Vacuum

Volumn 66, Issue 1, 2002, Pages 71-76

  Meng, F Y ^a   Wong, W K ^a   Shang, N G ^a   Li, Quan ^a   Bello, I ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Field emission; Ion beam; Nanoscale tips

Indexed keywords

ARGON; ELECTRON EMISSION; ION BOMBARDMENT; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

NANOSCALE TIPS; SEEDING MATERIALS;

NANOSTRUCTURED MATERIALS;

EID: 0036606477     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(01)00474-2     Document Type: Article

References (18)