High-resolution magnetic Co supertips grown by a focused electron beam

Applied Physics Letters

Volumn 80, Issue 25, 2002, Pages 4792-4794

  Utke, I ^a   Hoffmann, P ^a   Berger, R ^b   Scandella, L ^c  

^a EPFL   (Switzerland)

^b IBM   (Germany)

^c Nanosurf AG   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CARBONACEOUS MATRIX; CO CLUSTERS; COBALT CARBONYL; EXPOSURE PARAMETERS; FOCUSED ELECTRON BEAMS; HIGH ASPECT RATIO; HIGH RESOLUTION; MAGNETIC FORCE MICROSCOPES; MAGNETIC TIP; MAGNETIC TRANSITIONS; RECORDING MEDIA; SCANNING ELECTRON MICROSCOPE; SILICON TIPS; TIP GEOMETRY;

ASPECT RATIO; COBALT; COBALT COMPOUNDS; ELECTRON BEAMS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

MAGNETISM;

EID: 79956056203     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1489097     Document Type: Article

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