Experimental investigation on the quasi-ballistic transport: Part II - Backscattering coefficient extraction and link with the mobility

IEEE Transactions on Electron Devices

Volumn 56, Issue 3, 2009, Pages 420-430

  Barral, Vincent ^a,b   Poiroux, Thierry ^a   Munteanu, Daniela ^b   Autran, Jean Luc ^b,d,e   Deleonibus, Simon ^c  

^a CEA GRENOBLE   (France)

^b CNRS   (France)

^c CEA LETI   (France)

^d AIX MARSEILLE UNIVERSITY   (France)

^e INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

Backscattering coefficient; Ballistic ratio; Injection velocity; Linear regime; Mean free path; Mobility; SOI MOSFETs

Indexed keywords

BALLISTICS; MOSFET DEVICES;

BACKSCATTERING COEFFICIENT; INJECTION VELOCITY; LINEAR REGIME; MEAN-FREE PATH; MOBILITY; SOI MOSFETS;

BACKSCATTERING;

EID: 62749086649     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2011682     Document Type: Article

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