Re-examination of Subband Structure Engineering in Ultra-Short Channel MOSFETs under Ballistic Carrier Transport

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2003, Pages 115-116

  Takagi, Shin Ichi ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER COMMUNICATION; CONCENTRATION (PROCESS); ELECTRONIC DENSITY OF STATES; POWER SUPPLY CIRCUITS; QUANTUM THEORY; SILICON ON INSULATOR TECHNOLOGY; TRANSPORT PROPERTIES;

BALLISTIC CARRIER TRANSPORT;

MOSFET DEVICES;

EID: 0141649555     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. R. Chau, Si Nanoelectronics (2001) 2
2. B. Yu et al., IEDM(2001) 937
3. B. Doris et al. IEDM(2002) 267
4. K. Natori, JAP76(1994)4879
5. M. Lundstrom, ED49(2002)133
6. K. Natori, SSDM(2002)16
7. S. Takagi et al., IEDM(1997)219