On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography

Journal of Magnetism and Magnetic Materials

Volumn 321, Issue 8, 2009, Pages 935-943

  Zheng, R K ^a   Moody, M P ^a   Gault, B ^a   Liu, Z W ^a   Liu, Hui ^b   Ringer, S P ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b NANKAI UNIVERSITY   (China)

Author keywords

Atom probe tomography; Clustering; Diluted magnetic semiconductor; Secondary phase; Spintronics

Indexed keywords

ATOMS; BUILDING MATERIALS; CRYSTAL ATOMIC STRUCTURE; CRYSTALS; CURIE TEMPERATURE; DIAGNOSTIC RADIOGRAPHY; ELECTRIC CONDUCTIVITY; FERROMAGNETISM; MICROELECTRONICS; NANOTECHNOLOGY; PROBES; SEMICONDUCTING SILICON COMPOUNDS; SIPHONS; TOMOGRAPHY;

ATOM PROBE TOMOGRAPHY; CLUSTERING; DILUTED MAGNETIC SEMICONDUCTOR; SECONDARY PHASE; SPINTRONICS;

MAGNETIC SEMICONDUCTORS;

EID: 61649120127     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2008.03.014     Document Type: Article

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