Atom probe specimen fabrication methods using a dual FIB/SEM

Ultramicroscopy

Volumn 107, Issue 9, 2007, Pages 756-760

  Saxey, D W ^a   Cairney, J M ^a   McGrouther, D ^b   Honma, T ^a   Ringer, S P ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Atom probe; Focused ion beam; Specimen preparation

Indexed keywords

ELECTROLYTIC POLISHING; FOCUSED ION BEAMS; SPECIMEN PREPARATION;

ATOM PROBE SPECIMEN FABRICATION METHODS; SITE SPECIFIC ANALYSIS;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; ELECTRODE; FOCUSED ION BEAM; LASER; MECHANICAL PROBE; TISSUE PREPARATION;

EID: 34249035172     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.02.024     Document Type: Article

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