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Volumn 27, Issue 2, 2009, Pages

Chemical and structural properties of atomic layer deposited La2 O3 films capped with a thin Al2 O3 layer

Author keywords

[No Author keywords available]

Indexed keywords


EID: 61449255372     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3079632     Document Type: Letter
Times cited : (11)

References (45)
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    • (2007) Rare Earth Oxide Thin Films: Growth, Characterization and Applications , vol.106 , pp. 1-14
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    • 0365-110X 10.1107/S0365110X67000234, ();, J. Appl. Crystallogr. 2, 65 (1969).
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    • (1967) Acta Crystallogr. , vol.22 , pp. 151
    • Rietveld, H.M.1    Rietveld, H.M.2
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    • ICSD, Inorganic Crystal Structure Data 2008-1, File No. 200090.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.