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Volumn 91, Issue 10, 2007, Pages

Vibrational and electrical properties of hexagonal La2 O3 films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC LAYER DEPOSITION; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; LANTHANUM COMPOUNDS; PERMITTIVITY; VACUUM;

EID: 34548475050     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2779108     Document Type: Article
Times cited : (64)

References (13)
  • 1
    • 34248397024 scopus 로고    scopus 로고
    • Topics in Applied Physics, Vol. edited by M.Fanciulli and G.Scarel (Springer, Berlin
    • Rare Earth Oxide Thin Films: Growth, Characterization, and Applications, Topics in Applied Physics, Vol. 106, edited by, M. Fanciulli, and, G. Scarel, (Springer, Berlin, 2007), pp. 1-14.
    • (2007) Rare Earth Oxide Thin Films: Growth, Characterization, and Applications , vol.106 , pp. 1-14
  • 9
    • 34548499573 scopus 로고    scopus 로고
    • Inorganic Crystal Structure Data (ICSD), File No. 28555
    • Inorganic Crystal Structure Data (ICSD), File No. 28555, 2007.
    • (2007)
  • 10
    • 34548511840 scopus 로고    scopus 로고
    • Inorganic Crystal Structure Data (ICSD), File No. 94315
    • Inorganic Crystal Structure Data (ICSD), File No. 94315, 2007.
    • (2007)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.