Waveform observation of digital single-event transients employing monitoring transistor technique

IEEE Transactions on Nuclear Science

Volumn 55, Issue 6, 2008, Pages 2872-2879

  Kobayashi, Daisuke ^a,b   Hirose, Kazuyuki ^a,b   Yanagawa, Yoshimitsu ^c   Ikeda, Hirokazu ^a,b   Saito, Hirobumi ^a,c   Ferlet Cavrois, Véronique ^d   McMorrow, Dale ^e   Gaillardin, Marc ^d   Paillet, Philippe ^d   Arai, Yasuo ^b,f   Ohno, Morifumi ^g  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d CEA DIF   (France)

^e NAVAL RESEARCH LABORATORY   (United States)

^f HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^g OKI ELECTRIC INDUSTRY CO   (Japan)

Author keywords

Integrated circuit radiation effects; Pulsed laser irradiation; Semiconductor device radiation effects; Single event transients (SETs); Soft errors; Waveform observations

Indexed keywords

ELECTRIC CONDUCTIVITY; ERROR CORRECTION; ERRORS; HIGH ELECTRON MOBILITY TRANSISTORS; INTEGRATED CIRCUITS; IRRADIATION; LASERS; LOGIC GATES; PULSED LASER APPLICATIONS; RADIATION; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR LASERS; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR SWITCHES; TRANSIENTS; TRANSISTORS;

INTEGRATED CIRCUIT RADIATION EFFECTS; PULSED LASER IRRADIATION; SEMICONDUCTOR DEVICE RADIATION EFFECTS; SINGLE EVENT TRANSIENTS (SETS); SOFT ERRORS; WAVEFORM OBSERVATIONS;

RADIATION EFFECTS;

EID: 58949099730     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2006836     Document Type: Conference Paper

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