Comparison of error rates in combinational and sequential logic

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2209-2216

  Buchner S ^a   Baze, M ^a,b   Brown, D ^a,c   McMorrow, D ^a,c   Malinger, J ^a,b,c  

^a SFA INC   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; COMPUTER SOFTWARE; ERROR ANALYSIS; PULSED LASER APPLICATIONS; RADIATION EFFECTS; SEQUENTIAL CIRCUITS;

SINGLE EVENT UPSET (SEU);

ELECTRIC NETWORK ANALYSIS;

EID: 0031367158     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659037     Document Type: Article

References (11)

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