Feasibility study of a table-based SET-pulse estimation in logic cells from heavy-ion-induced transient currents measured in a single MOSFET

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2347-2354

  Kobayashi, Daisuke ^a,b,c   Hirose, Kazuyuki ^a,b,c   Makino, Takahiro ^c   Ikeda, Hirokazu ^a   Saito, Hirobumi ^a,b,d  

^a IEEE   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^c GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

Graphical derivation; Heavy ions; Integrated circuit radiation effects; Look up table modeling; Semiconductor device radiation effects; Single event transients (SETs); Transient currents

Indexed keywords

GRAPHICAL DERIVATION; INTEGRATED CIRCUIT RADIATION EFFECTS; LOOK-UP TABLE MODELING; SEMICONDUCTOR DEVICE RADIATION EFFECTS; SINGLE EVENT TRANSIENTS (SETS); TRANSIENT CURRENTS;

DRAIN CURRENT; ELECTRIC CURRENTS; EXTRAPOLATION; HEAVY IONS; TABLE LOOKUP; TRANSIENT ANALYSIS; TWO DIMENSIONAL; VOLTAGE CONTROL;

MOSFET DEVICES;

EID: 37249086178     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.907679     Document Type: Conference Paper

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