Single event transient pulsewidths in digital microcircuits

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3285-3290

  Gadlage, Matthew J ^a   Schrimpf, Ronald D ^b   Benedetto, Joseph M ^c   Eaton, Paul H ^c   Mavis, David G ^c   Sibley, Mike ^c   Avery, Keith ^c   Turflinger, Thomas L ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c MISSION RESEARCH CORPORATION   (United States)

Author keywords

Digital single event transients (DSETs); Heavy ions; Single event effects (SEEs); SPICE

Indexed keywords

APPROXIMATION THEORY; CMOS INTEGRATED CIRCUITS; ERROR ANALYSIS; HEAVY IONS; IONIZATION; RADIATION EFFECTS;

DIGITAL SINGLE EVENT TRANSIENTS (DSET); SINGLE EVENT EFFECTS (SEE); SPICE; STATIC ERRORS;

DIGITAL CIRCUITS;

EID: 11044230874     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839174     Document Type: Conference Paper

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