The "state of the art" of the diffraction analysis of crystallite size and lattice strain

Zeitschrift fur Kristallographie

Volumn 223, Issue 9, 2008, Pages 552-560

  Mittemeijer, Eric J ^a   Welzel, Udo ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Coherency of diffraction; Crystallite size; Line profile analysis; Microstrain; X ray powder diffraction

Indexed keywords

EID: 58149359374     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2008.1213     Document Type: Conference Paper

References (65)

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